no code implementations • 28 Jun 2023 • Valentin Munteanu, Vladimir Starostin, Alessandro Greco, Linus Pithan, Alexander Gerlach, Alexander Hinderhofer, Stefan Kowarik, Frank Schreiber
Due to the lack of phase information, determining the physical parameters of multilayer thin films from measured neutron and X-ray reflectivity curves is, on a fundamental level, an underdetermined inverse problem.
1 code implementation • 22 Feb 2022 • Vladimir Starostin, Valentin Munteanu, Alessandro Greco, Ekaterina Kneschaurek, Alina Pleli, Florian Bertram, Alexander Gerlach, Alexander Hinderhofer, Frank Schreiber
Understanding the processes of perovskite crystallization is essential for improving the properties of organic solar cells.
no code implementations • 7 Oct 2019 • Alessandro Greco, Vladimir Starostin, Christos Karapanagiotis, Alexander Hinderhofer, Alexander Gerlach, Linus Pithan, Sascha Liehr, Frank Schreiber, Stefan Kowarik
X-ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films.