Achieving Pareto Optimality using Efficient Parameter Reduction for DNNs in Resource-Constrained Edge Environment

no code implementations • 14 Mar 2024 • Atah Nuh Mih, Alireza Rahimi, Asfia Kawnine, Francis Palma, Monica Wachowicz, Rickey Dubay, Hung Cao

The results of the Caltech-101 image classification show that our model has a better test accuracy (76. 21%) than Xception (75. 89%), uses less memory on average (847. 9MB) than Xception (874. 6MB), and has faster training and inference times.

Defect Detection Image Classification +1

TransferD2: Automated Defect Detection Approach in Smart Manufacturing using Transfer Learning Techniques

no code implementations • 26 Feb 2023 • Atah Nuh Mih, Hung Cao, Joshua Pickard, Monica Wachowicz, Rickey Dubay

Our proposed approach can be applied in defect detection applications where insufficient data is available for training a model and can be extended to identify imperfections in new unseen data.

Defect Detection Transfer Learning