no code implementations • 25 Nov 2023 • Tapan Ganatma Nakkina, Adithyaa Karthikeyan, Yuhao Zhong, Ceyhun Eksin, Satish T. S. Bukkapatnam
This paper introduces an approach based on graph Fourier analysis to automatically identify defective images, as well as crucial graph Fourier coefficients that inform the defects in images amidst highly textured backgrounds.
