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Learning graph-Fourier spectra of textured surface images for defect localization
This paper introduces an approach based on graph Fourier analysis to automatically identify defective images, as well as crucial graph Fourier coefficients that inform the defects in images amidst highly textured backgrounds.
EBLIME: Enhanced Bayesian Local Interpretable Model-agnostic Explanations
We propose EBLIME to explain black-box machine learning models and obtain the distribution of feature importance using Bayesian ridge regression models.
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